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Shallow CNNs for the Reliable Detection of Facial Marks

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dc.contributor.authorZeinstra, Chris
dc.contributor.authorHaasnoot, Erwin
dc.contributor.editorBrömme, Arslan
dc.contributor.editorBusch, Christoph
dc.contributor.editorDantcheva, Antitza
dc.contributor.editorRathgeb, Christian
dc.contributor.editorUhl, Andreas
dc.date.accessioned2019-06-17T10:00:30Z
dc.date.available2019-06-17T10:00:30Z
dc.date.issued2018
dc.description.abstractFacial marks are local irregularities of skin texture. Their type and/or spatial pattern can be used as a (soft) biometric modality in several applications. A key requirement for a biometric system that utilises facial marks is their reliable detection. Detection methods typically use a blob detector followed by heuristic post processing steps to reduce the number of false positives. In this paper, we consider shallow Convolutional Neural Networks (CNNs) for facial mark detection. The choice of this network type seems natural as it learns multiple (non) blob detectors; shallow refers to the fact that we only consider CNNs up to three layers.We show that (a) these CNNs successfully address the false positive problem, (b) remove the need for post processing steps, and (c) outperform a classic blob detector, approaches taken in previous studies and some other non CNN type classifiers in terms of EER and FMR at TMR=0.95.en
dc.identifier.isbn978-3-88579-676-4
dc.identifier.pissn1617-5468
dc.identifier.urihttps://dl.gi.de/handle/20.500.12116/23812
dc.language.isoen
dc.publisherKöllen Druck+Verlag GmbH
dc.relation.ispartofBIOSIG 2018 - Proceedings of the 17th International Conference of the Biometrics Special Interest Group
dc.relation.ispartofseriesLecture Notes in Informatics (LNI) - Proceedings, Volume P-283
dc.subjectFacial Marks
dc.subjectImage Processing
dc.subjectForensics
dc.subjectCNN.
dc.titleShallow CNNs for the Reliable Detection of Facial Marksen
dc.typeText/Conference Paper
gi.citation.publisherPlaceBonn
gi.conference.date26.-28. September 2018
gi.conference.locationDarmstadt

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P282 - BIOSIG 2018 - Proceedings of the 17th International Conference of the Biometrics Special Interest Group