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Improvement of Iris Recognition based on Iris-Code Bit-Error Pattern Analysis

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dc.contributor.authorRathgeb,Christian
dc.contributor.authorBusch,Christoph
dc.contributor.editorBrömme,Arslan
dc.contributor.editorBusch,Christoph
dc.contributor.editorDantcheva,Antitza
dc.contributor.editorRathgeb,Christian
dc.contributor.editorUhl,Andreas
dc.date.accessioned2017-09-26T09:21:02Z
dc.date.available2017-09-26T09:21:02Z
dc.date.issued2017
dc.description.abstractIn this paper an advanced iris-biometric comparator is presented. In the proposed scheme an analysis of bit-error patterns produced by Hamming distance-based iris-code comparisons is performed. The lengths of sequences of horizontal consecutive mis-matching bits are measured and a frequency distribution is estimated. The difference of the extracted frequency distribution to that of an average genuine one obtained from a training set is used as a second comparison score. This score is then used together with the fractional Hamming distance in order to improve the recognition accuracy of an iris recognition system. In experimental evaluations relative improvements of approximately 45% and 10% in terms of false non-match rate at a false match rate of 0.01% are achieved on the CASIAv4-Interval and the BioSecure iris databases, respectively.en
dc.identifier.isbn978-3-88579-664-0
dc.identifier.pissn1617-5468
dc.identifier.urihttps://dl.gi.de/handle/20.500.12116/4662
dc.language.isoen
dc.publisherGesellschaft für Informatik, Bonn
dc.relation.ispartofBIOSIG 2017
dc.relation.ispartofseriesLecture Notes in Informatics (LNI) - Proceedings, Volume P-70
dc.subjectBiometrics
dc.subjectiris recognition
dc.subjectiris-code
dc.subjectbit-error analysis
dc.subjectimproved comparator
dc.titleImprovement of Iris Recognition based on Iris-Code Bit-Error Pattern Analysisen
gi.citation.endPage49
gi.citation.startPage41
gi.conference.date20.-22. September 2017
gi.conference.locationDarmstadt, Germany
gi.conference.sessiontitleRegular Research Papers

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P270 - BIOSIG 2017 - Proceedings of the 16th International Conference of the Biometrics Special Interest Group