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dc.contributor.authorLudwig, Von Matthias
dc.date2011-04-01
dc.date.accessioned2018-01-16T09:21:35Z
dc.date.available2018-01-16T09:21:35Z
dc.date.issued2011
dc.identifier.issn1867-5913
dc.identifier.urihttp://dl.gi.de/handle/20.500.12116/13300
dc.publisherSpringer
dc.relation.ispartofWirtschaftsinformatik & Management: Vol. 3, No. 2
dc.relation.ispartofseriesWirtschaftsinformatik & Management
dc.titleWie schlechte Tests doch helfen können
dc.typeText/Journal Article
mci.reference.pages74-74
gi.identifier.doi10.1365/s35764-011-0034-5


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