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An RRAM-based building block for reprogrammable non-uniform sampling ADCs

dc.contributor.authorVishwakarma, Abhinav
dc.contributor.authorFritscher, Markus
dc.contributor.authorHagelauer, Amelie
dc.contributor.authorReichenbach, Marc
dc.date.accessioned2023-06-06T10:40:13Z
dc.date.available2023-06-06T10:40:13Z
dc.date.issued2023
dc.description.abstractRRAM devices have recently seen wide-spread adoption into applications such as neural networks and storage elements since their inherent non-volatility and multi-bit-capability renders them a possible candidate for mitigating the von-Neumann bottleneck. Researchers often face difficulties when developing edge devices, since dealing with sensors detecting parameters such as humidity or temperature often requires large and power-consuming ADCs. We propose a possible mitigation, namely using a RRAM device in combination with a comparator circuit to form a basic block for threshold detection. This can be expanded towards programmable non-uniform sampling ADCs, significantly reducing both area and power consumption since significantly smaller bit-resolutions are required. We demonstrate how a comparator circuit designed in 130 nm technology can be reprogrammed by programming the incorporated RRAM device. Our proposed building block consumes 83 µW.en
dc.identifier.doi10.1515/itit-2023-0021
dc.identifier.pissn2196-7032
dc.identifier.urihttps://dl.gi.de/handle/20.500.12116/41704
dc.language.isoen
dc.publisherDe Gruyter
dc.relation.ispartofit - Information Technology: Vol. 65, No. 1-2
dc.subjectADC; CMOS circuit; comparator; memristor; non-uniform sampling; sensors
dc.titleAn RRAM-based building block for reprogrammable non-uniform sampling ADCsen
dc.typeText/Journal Article
gi.citation.endPage51
gi.citation.publisherPlaceBerlin
gi.citation.startPage39
gi.conference.sessiontitleArticle

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