An RRAM-based building block for reprogrammable non-uniform sampling ADCs
| dc.contributor.author | Vishwakarma, Abhinav | |
| dc.contributor.author | Fritscher, Markus | |
| dc.contributor.author | Hagelauer, Amelie | |
| dc.contributor.author | Reichenbach, Marc | |
| dc.date.accessioned | 2023-06-06T10:40:13Z | |
| dc.date.available | 2023-06-06T10:40:13Z | |
| dc.date.issued | 2023 | |
| dc.description.abstract | RRAM devices have recently seen wide-spread adoption into applications such as neural networks and storage elements since their inherent non-volatility and multi-bit-capability renders them a possible candidate for mitigating the von-Neumann bottleneck. Researchers often face difficulties when developing edge devices, since dealing with sensors detecting parameters such as humidity or temperature often requires large and power-consuming ADCs. We propose a possible mitigation, namely using a RRAM device in combination with a comparator circuit to form a basic block for threshold detection. This can be expanded towards programmable non-uniform sampling ADCs, significantly reducing both area and power consumption since significantly smaller bit-resolutions are required. We demonstrate how a comparator circuit designed in 130 nm technology can be reprogrammed by programming the incorporated RRAM device. Our proposed building block consumes 83 µW. | en |
| dc.identifier.doi | 10.1515/itit-2023-0021 | |
| dc.identifier.pissn | 2196-7032 | |
| dc.identifier.uri | https://dl.gi.de/handle/20.500.12116/41704 | |
| dc.language.iso | en | |
| dc.publisher | De Gruyter | |
| dc.relation.ispartof | it - Information Technology: Vol. 65, No. 1-2 | |
| dc.subject | ADC; CMOS circuit; comparator; memristor; non-uniform sampling; sensors | |
| dc.title | An RRAM-based building block for reprogrammable non-uniform sampling ADCs | en |
| dc.type | Text/Journal Article | |
| gi.citation.endPage | 51 | |
| gi.citation.publisherPlace | Berlin | |
| gi.citation.startPage | 39 | |
| gi.conference.sessiontitle | Article |