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Towards Fault-based Generation of Test Cases for Dependable Embedded Software

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dc.contributor.authorHerzner, Wolfgang
dc.contributor.authorSchlick, Rupert
dc.contributor.authorBrandl, Harald
dc.contributor.authorWiessalla, Johannes
dc.date.accessioned2023-03-20T10:07:57Z
dc.date.available2023-03-20T10:07:57Z
dc.date.issued2011
dc.description.abstractIn the European project MOGENTES1 methods for model-based generation of efficient test cases are developed. A special focus is laid on test cases, which not only allow for assessing the fulfillment of requirements, but in particular looking for potential faults – or prove their absence. This is achieved by mutation-based testing: an original model is modified to simulate faults, and then test cases are searched which are able to distinguish between original and mutated model. This paper gives an overview of MOGENTES, presents an application example from the automotive domain, and summarizes the results from this example.en
dc.identifier.pissn0720-8928
dc.identifier.urihttps://dl.gi.de/handle/20.500.12116/40958
dc.language.isoen
dc.publisherGeselllschaft für Informatik e.V.
dc.relation.ispartofSoftwaretechnik-Trends Band 31, Heft 3
dc.subjectfulfillment of functional (safety) requirements
dc.subjectmodel-based test case generation (MBTCG)
dc.subjectfault-models
dc.subjectmutation-based testing
dc.subjectMOGENTES
dc.titleTowards Fault-based Generation of Test Cases for Dependable Embedded Softwareen
dc.typeText/Journal Article
gi.citation.publisherPlaceBonn
gi.conference.sessiontitleBerichte aus den Fachgruppen und Arbeitskreisen

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Softwaretechnik-Trends 31(3) - 2011