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Code Museums as Functional Tests for Static Analyses

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dc.contributor.authorSpeicher, Daniel
dc.contributor.authorNonnen, Jan
dc.contributor.authorBremm, Andri
dc.date.accessioned2017-12-06T09:22:18Z
dc.date.available2017-12-06T09:22:18Z
dc.date.issued2012
dc.description.abstractDaniel Speicher, Jan Nonnen, Andri Bremm University of Bonn, Computer Science III, Bonn, Germany {dsp, nonnen, bremm}@cs.uni-bonn.deen
dc.identifier.doi10.1007/BF03323482
dc.identifier.pissn0720-8928
dc.identifier.urihttps://dl.gi.de/handle/20.500.12116/8664
dc.language.isoen
dc.publisherKöllen Druck & Verlag GmbH
dc.relation.ispartofSoftwaretechnik-Trends: Vol. 32, No. 2
dc.relation.ispartofseriesSoftwaretechnik-Trends
dc.subjectLogic Program
dc.subjectDesign Pattern
dc.subjectFunctional Test
dc.subjectProgram Element
dc.subjectJava Code
dc.titleCode Museums as Functional Tests for Static Analysesen
dc.typeText/Journal Article
gi.citation.endPage64
gi.citation.startPage63

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Softwaretechnik-Trends 32(2) - 2012