Speicher, DanielNonnen, JanBremm, Andri2017-12-062017-12-062012https://dl.gi.de/handle/20.500.12116/8664Daniel Speicher, Jan Nonnen, Andri Bremm University of Bonn, Computer Science III, Bonn, Germany {dsp, nonnen, bremm}@cs.uni-bonn.deenLogic ProgramDesign PatternFunctional TestProgram ElementJava CodeCode Museums as Functional Tests for Static AnalysesText/Journal Article10.1007/BF033234820720-8928